Comment 1 Oleg Besedin 2012-01-31 16:53:07 EST

In short:

Those tests won't work with the current E4 code. I am surprised that they worked in 3.x; the fact that they currently "pass" in 4.x means that those tests are incorrectly constructed.

I'd recommend for the time being remove PartsReferencesTestSuite tests from automated runs and eventually re-do it using session tests framework.

====

Details:

What those tests do is that after some processing they dispose and recreate Display without taking down and starting up of the running instance.:

ViewsReferencesTest#disposeDisplay()
		display.dispose();

ViewsReferencesTest#createDisplay()
		display = PlatformUI.createDisplay();

The slowdown is [at least in part] caused by thousands (7K in a single test) of SWT exceptions thrown and logged:
Display.class :
		if (isDisposed ()) error (SWT.ERROR_DEVICE_DISPOSED);
"Device is disposed"

The first particular stumbling point is this code in E4Application:
		appContext.set(UISynchronize.class, new UISynchronize() {

			public void syncExec(Runnable runnable) {
				display.syncExec(runnable);
			}

			public void asyncExec(Runnable runnable) {
				display.asyncExec(runnable);
			}
		});

but I seriously doubt that this is the only place that will have to be fixed. Even E4Workbench#createE4Workbench(IApplicationContext applicationContext, final Display display) describes display as "final".

Comment 2 Rolf Theunissen 2019-05-26 12:38:05 EDT

PartsReferencesTestSuite is no longer available:

Bug 441937 - Retire PartsReferencesTestSuite and related tests