Community
Participate
Working Groups
Affected tests: org.eclipse.xtext.xbase.tests.serializer.XbaseSerializerWithNodeModelTest.testForLoop_04() org.eclipse.xtext.xbase.tests.serializer.XbaseSerializerWithNodeModelTest.testSubtractionOnIntegers() and ----- if (e.getMessage().contains("No EObjectDescription could be found")) return; ----- in org.eclipse.xtext.xbase.tests.serializer.XbaseSerializerWithoutNodeModelTest
This is a nice one: It turned out that AbstractScope#getElements filters the parent's elements twice. First it uses the shadowing key and afterwards the plain qualified name is used - which is wrong for feature scopes. The xtext tests seem to be green after I've applied the fix and the serializer tests for xbase are a lot greener, too. That is, only the right recursion issues remain in the Xbase-serialization test suite.
Pushed to master.
awesome, thx!
I have to provide some tests to make sure that the change did not introduce a regression bug for a scenario with local aliased elements that introduce duplicate names.
Added some tests and fixed the expected regression.
Closing all bugs that were set to RESOLVED before Neon.0