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Enhancement request added the support for Defect tracking in Test log viewer which can be used to associate defect records with test log viewer. However the current implementation only allows association after the test log is generated. To allow association of defect records during log generation, we need to extend the current test common event for generating the xml fragments, as well as event loader for create the model element from the xml fragments. There are consuming product already creating defects during test execution time (before log is generated). Now the execution history model also allows the association of these defects with the test log. This is the missing link in between for the complete picture. Scott, please feel free to assign this bug to me. Thanks.
"Enhancement request" in the description refers to bug 131547. Fix in hand. Attaching patches.
Created attachment 38056 [details] patch for package org.eclipse.hyades.loaders.common
Created attachment 38057 [details] patch for package org.eclipse.hyades.test.common.event
Fixed.
ACTION: Please verify/close this defect.
Closing by default since not closed by the originator in the 7+ months since being resolved. Please reopen if the issue is still present in the latest TPTP release or the resolution is not correct.